Abstract: Face is one of the most widely used biometric for person recognition. Various face recognition systems have been developed over the last two decades. Deep learning methods, enabled by the vast improvements in processing hardware coupled with the ubiquity of face data and algorithmic development, have led to significant improvements in face recognition accuracy, particularly in unconstrained scenarios. Also, largely driven by social network companies, progress in face recognition research, development and deployment have focused on faces collected in visible regimes of the electromagnetic spectrum. Thermal imaging has been proposed for nighttime and low-light face recognition when external illumination is not feasible due to various collection considerations. In this talk, I will provide some recent advances in thermal to visible face synthesis and verification using deep learning methods.
Bio: Vishal M. Patel is an Associate Professor in the Department of Electrical and Computer Engineering (ECE) at Johns Hopkins University. Prior to joining Hopkins, he was an A. Walter Tyson Assistant Professor in the Department of ECE at Rutgers University and a member of the research faculty at the University of Maryland Institute for Advanced Computer Studies (UMIACS). He completed his Ph.D. in Electrical Engineering from the University of Maryland, College Park, MD, in 2010. He has received a number of awards including the 2021 NSF CAREER Award, the 2016 ONR Young Investigator Award, the 2016 Jimmy Lin Award for Invention, A. Walter Tyson Assistant Professorship Award, Best Paper Awards at IEEE AVSS 2017 and 2019, Best Paper Award at IEEE BTAS 2015, Honorable Mention Paper Award at IAPR ICB 2018, two Best Student Paper Awards at IAPR ICPR 2018, and Best Poster Awards at BTAS 2015 and 2016. He is an Associate Editor of the IEEE Signal Processing Magazine, Pattern Recognition Journal, and serves on the Machine Learning for Signal Processing (MLSP) Committee of the IEEE Signal Processing Society. He serves as the vice president of conferences for the IEEE Biometrics Council.